US20050029554A1 - Molded ball grid array - Google Patents
Molded ball grid array Download PDFInfo
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- US20050029554A1 US20050029554A1 US10/930,520 US93052004A US2005029554A1 US 20050029554 A1 US20050029554 A1 US 20050029554A1 US 93052004 A US93052004 A US 93052004A US 2005029554 A1 US2005029554 A1 US 2005029554A1
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- conductive balls
- substrate
- encapsulant
- set forth
- grid array
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
- H01L23/31—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape
- H01L23/3107—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
- H01L21/56—Encapsulations, e.g. encapsulation layers, coatings
- H01L21/565—Moulds
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
- H01L2224/0554—External layer
- H01L2224/05599—Material
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/06—Structure, shape, material or disposition of the bonding areas prior to the connecting process of a plurality of bonding areas
- H01L2224/061—Disposition
- H01L2224/0612—Layout
- H01L2224/0613—Square or rectangular array
- H01L2224/06134—Square or rectangular array covering only portions of the surface to be connected
- H01L2224/06136—Covering only the central area of the surface to be connected, i.e. central arrangements
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- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
- H01L2224/45001—Core members of the connector
- H01L2224/45099—Material
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48225—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
- H01L2224/4824—Connecting between the body and an opposite side of the item with respect to the body
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- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73201—Location after the connecting process on the same surface
- H01L2224/73215—Layer and wire connectors
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- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/85—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
- H01L2224/8538—Bonding interfaces outside the semiconductor or solid-state body
- H01L2224/85399—Material
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- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/42—Wire connectors; Manufacturing methods related thereto
- H01L24/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L24/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/00014—Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/153—Connection portion
- H01L2924/1531—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
- H01L2924/15311—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a ball array, e.g. BGA
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/181—Encapsulation
Definitions
- the present invention relates generally to microelectronic packaging and, more particularly, to a method and apparatus for encapsulating a ball grid array (BGA) in a molding compound.
- BGA ball grid array
- the packaging of electrical circuits is a key element in the technological development of any device containing electrical components.
- Several technologies have been developed to provide a means of mounting these electrical components on a surface of a substrate, such as a printed circuit board (PCB).
- PCB printed circuit board
- Fine pitch surface mount (FPT), pin grid array (PGA), and ball grid array (BGA) are examples of leading surface mount technologies.
- BGA technology offers several advantages over FPT and PGA.
- advantages of BGA are: reduced co-planarity problems, since there are no leads; reduced placement problems; reduced paste printing problems; reduced handling damage; smaller size; better electrical and thermal performance; better package yield; better board assembly yield; higher interconnect density; multi-layer interconnect options; higher number of IO's for a given footprint; easier extension to multi-chip modules; and faster design-to-production cycle time.
- a BGA semiconductor package generally includes a semiconductor chip mounted on the top surface of a substrate.
- the semiconductor chip may be electrically coupled to the substrate by bond wires.
- the substrate contains conductive routing which allows the signals to pass from the semiconductor chip on the top side of the substrate, through the substrate, and to pads on the backside of the substrate.
- a plurality of solder balls are deposited and electrically coupled to the pads on the backside of the substrate to be used as input/output terminals for electrically connecting the substrate to a PCB or other external device.
- One problem with conventional BGA packaging is the need to protect the electrical interface between the chip and the substrate.
- the implementation of the encapsulation process presents many challenges.
- FIG. 1 illustrates a block diagram of an exemplary processor-based device in accordance with the present invention
- FIG. 2 illustrates an exemplary memory array
- FIG. 3 illustrates an exemplary encapsulated circuit package
- FIG. 4 illustrates a cross sectional view of a BOC package
- FIG. 5 illustrates an encapsulated circuit package in accordance with one aspect of the present techniques
- FIG. 6 illustrates a cross-sectional view of an encapsulated circuit package in accordance with one aspect of the present techniques, taken along line 6 - 6 ;
- FIG. 7A illustrates an enlarged view of the solder ball area illustrated in FIG. 6 ;
- FIG. 7B illustrates a first alternate embodiment of the solder ball area illustrated in FIG. 6 ;
- FIG. 7C illustrates a second alternate embodiment of the solder ball area illustrated in FIG. 6 ;
- FIG. 7D illustrates a third alternate embodiment of the solder ball area illustrated in FIG. 6 ;
- FIG. 8 illustrates an exploded view of an exemplary mold used to create the encapsulated circuit package illustrated in FIG. 5 ;
- FIG. 9 illustrates a cross-sectional view of an encapsulated circuit package in accordance with another aspect of the present techniques.
- FIG. 10 illustrates an enlarged view of the solder ball area illustrated in FIG. 9 ;
- FIG. 11 illustrates an exploded view of an exemplary mold used to create the encapsulated circuit package illustrated in FIG. 9 ;
- FIG. 12 illustrates an enlarged cross-sectional view of the solder ball area during the encapsulation process in accordance with the embodiment illustrated in FIG. 9 .
- FIG. 1 a block diagram depicting an exemplary processor-based device generally designated by the reference numeral 10 is illustrated.
- the device 10 may be any of a variety of different types, such as a computer, pager, cellular telephone, personal organizer, control circuit, etc.
- a processor 12 such as a microprocessor, controls many of the functions of the device 10 .
- the device 10 typically includes a power supply 14 .
- the power supply 14 would advantageously include permanent batteries, replaceable batteries, and/or rechargeable batteries.
- the power supply 14 may also include an AC adapter, so the device may be plugged into a wall outlet, for instance.
- the power supply 14 may also include a DC adapter, so that the device can be plugged into a vehicle cigarette lighter, for instance.
- a user interface 16 may be coupled to the processor 12 .
- the user interface 16 may include buttons, switches, a keyboard, a light pen, a mouse, and/or a voice recognition system, for instance.
- a display 18 may also be coupled to the processor 12 .
- the display 18 may include an LCD display, a CRT, LEDs, and/or an audio display, for example.
- an RF subsystem/baseband processor 20 may also be coupled to the processor 12 .
- the RF subsystem/baseband processor 20 may include an antenna that is coupled to an RF receiver and to an RF transmitter (not shown).
- a communications port 22 may also be coupled to the processor 12 .
- the communications port may be adapted to be coupled to a peripheral device 24 , such as a modem, a printer, or a computer, for instance, or to a network, such as a local area network or the Internet, for instance.
- Volatile memory 26 and non-volatile memory 28 may also be coupled to the processor 12 .
- FIG. 2 illustrates a multi-chip memory array 29 .
- the memory array 29 may be illustrative of volatile memory 26 or non-volatile memory 28 .
- a memory controller 31 is coupled to a plurality of memory devices 33 .
- the memory controller 31 and the memory devices 33 are mounted in a planar fashion on the same substrate 35 , such as a printed circuit board.
- this planar layout allows for only a limited number of memory devices 33 to be used depending on the surface area of the substrate 35 .
- FIG. 3 illustrates a partial cross-sectional view depicting an exemplary encapsulated circuit package 30 .
- the circuit package 30 typically includes a semiconductor chip 40 , such as a memory die.
- the semiconductor chip 40 is mounted on a substrate 50 and electrically coupled to the substrate 50 by bond wires 45 .
- Bond wires 45 are attached to bond pads 46 on the first surface 42 of the semiconductor chip 40 and to bond pads 47 on the first surface 52 of the substrate 50 .
- a molding compound 60 is generally used to encapsulate the semiconductor chip 40 .
- the molding compound 60 protects the semiconductor chip 40 and the bond wires 45 from external elements.
- Terminals such as pins or solder balls 70
- the substrate 50 also includes conductive routing and/or vias (not shown) to provide an electrical signal path from the solder pads 47 to the solder balls 70 .
- a board-on-chip (BOC) circuit package may be encapsulated, with molding compound disposed on both surfaces of the substrate 51 , as illustrated in FIG. 4 .
- the semiconductor chip 41 may be mounted with the first surface 42 of the semiconductor chip 41 placed in contact with the first surface 52 of the substrate 51 .
- a slot 43 is formed in the substrate 51 , and bond pads 46 on the first surface 42 of the semiconductor chip 41 are aligned so as to allow bond wires 45 to be attached to bond pads 46 on the first surface 42 of the semiconductor chip 41 , and further attached to bond pads 47 on the second surface 54 of the substrate 51 .
- molding compound 60 may be disposed on the second surface 44 of the semiconductor chip 41 which is not in contact with the substrate 51 and may be disposed on the first surface 52 of the substrate 51 .
- the molding compound 60 may be disposed through the slot 43 in the substrate 51 and on a portion of the second surface 54 of the substrate 51 .
- FIG. 5 illustrates an exemplary encapsulated circuit package 75 in accordance with one aspect of the present techniques.
- the molding compound 60 is used to encapsulate the entire circuit package 75 , including the backside of the circuit package 75 .
- the circuit package 75 is encapsulated with molding compound 60 in such a way as to provide openings in the molding compound 60 to allow the circuit package 75 to be coupled to a printed circuit board.
- cups 80 are formed in the molding compound 60 .
- the cups 80 are configured to receive solder balls (not shown) which provide electrical coupling of the circuit package 75 to a printed circuit board.
- the cups 80 are configured to align with pads 90 which are coupled to the second surface of the substrate 50 contained within the molding compound 60 .
- FIG. 6 illustrates a cross-sectional view of an encapsulated BOC circuit package 75 in accordance with one aspect of the present techniques, taken along line 6 - 6 .
- a semiconductor chip 41 is typically coupled to the substrate 51 by an adhesive 100 , such as a dielectric tape or non-conductive paste.
- the first surface 42 of the semiconductor chip 41 is coupled to the first surface 52 of the substrate 51 by adhesive 100 .
- the semiconductor chip 41 is electrically coupled to conductors of the substrate 51 by bond wires 45 .
- the bond wires 45 are coupled to bond pads 46 located on the first surface 42 of the semiconductor chip 41 and further coupled to bond pads 47 on the second surface 54 of the substrate 51 .
- the substrate 51 includes a slot 110 through which the bond wires 45 are attached.
- the circuit package 75 is encapsulated with the molding compound 60 which is deposited on the second surface 44 of the semiconductor chip 41 , the first surface 52 of the substrate 51 , through the slot 110 and onto the second surface 54 of the substrate 51 .
- Cup openings 80 are configured to align with solder pads 90 on the second surface 54 of the substrate 51 .
- the cups 80 advantageously have tapered walls 120 which facilitate alignment of the solder balls 70 with the solder pads 90 .
- FIG. 7A illustrates an enlarged view of the solder ball area illustrated in FIG. 6 .
- the cup 80 a in the molding compound 60 is configured such that the base of the cup is smaller than the solder pad 90 a.
- the solder mask used to dispense the solder balls 70 determine the solder ball 70 location.
- the tapered walls 120 allow for proper alignment of the solder ball 70 over the solder pad 90 a.
- the cup 80 a may be a hemisphere sized to hold a solder ball 70 as illustrated in FIG. 7C .
- the cup 80 a may be cylindrical in shape as illustrated in FIG. 7D .
- the solder pad 90 a is coupled to the second surface 54 of the substrate 51 to provide electrical coupling of the solder balls 70 to the substrate 51 .
- FIG. 7B illustrates an alternate embodiment of the solder ball area illustrated in FIG. 6 .
- the cup 80 b contained within the molding compound 60 is configured such that the opening is larger than the solder pad 90 b. While the tapered walls 120 in the cup 80 b may direct the alignment of the solder ball 70 within the cup 80 b, it is the location of the solder pad 90 b which actually determines the exact placement of the solder ball 70 , because the solder ball 70 will be attracted to the wetted solder pad 90 b during the re-flow process that couples the solder ball 70 to the substrate 51 .
- solder pad 90 b is coupled to the second surface 54 of substrate 51 to provide for electrical coupling between the solder ball 70 and the substrate 51 .
- FIG. 8 illustrates an exploded view of a mold 125 , which may include an upper mold 130 and a lower mold 140 used to create an encapsulated circuit package in accordance with the first aspect of the present techniques, illustrated with reference to FIGS. 5, 6 , 7 A and 7 B.
- the circuit package 75 is placed between the upper mold 130 and the lower mold 140 .
- a release liner 150 may be used to provide separation of the circuit package 75 from the upper mold 130 after the encapsulation process is complete.
- the upper mold 130 includes a plurality of protrusions 160 which are brought in contact with the solder pads (not shown) on the second surface 54 of substrate 51 .
- the protrusions 160 may be tapered to create the tapered walls of the cups 80 , as shown in FIGS. 5-7B .
- the protrusions 160 of the upper mold 130 are brought in contact with the solder pads 90 (separated by release liner 150 , if used).
- the second surface 54 of the substrate 51 is brought in contact with the upper mold 130
- the first surface 52 of the substrate 50 is brought in contact with the lower mold 140 .
- a molding compound is then injected into an opening (not shown) in the molds 130 and 140 .
- the circuit package 75 is separated from the molds 130 and 140 .
- the resulting circuit package 75 is encapsulated and includes the alignment cups used for solder ball deposition as described above.
- FIGS. 5-8 illustrate a technique for fabricating a molded ball grid array by encapsulating the device before disposing the solder balls.
- FIGS. 9-12 illustrate a second aspect of the present techniques, wherein the solder balls are disposed before the encapsulation process.
- FIG. 9 illustrates a cross-sectional view of an encapsulated package, such as a BOC package 162 , wherein the solder balls 70 are attached to the second surface 54 of the substrate 51 before the package 162 is encapsulated.
- a semiconductor chip 41 is typically coupled to the substrate 51 by an adhesive 100 .
- the semiconductor chip 41 is electrically coupled to conductors of the substrate by bond wires 45 , for example.
- the bond wires 45 are coupled to bond pads 46 located on the first surface 42 of the semiconductor chip 41 and further coupled to bond pads 47 on the second surface 54 of the substrate 51 .
- the substrate 51 includes a slot 110 through which the bond wires 45 are attached.
- FIG. 10 illustrates an enlarged view of the solder ball area illustrated in FIG. 9 .
- the solder balls 70 are coupled to the solder pads 90 before the deposition of the encapsulant 164 , there are no cups formed in the encapsulant 164 in which to deposit the solder ball 70 , as with the first exemplary technique described with reference to FIGS. 5-8 .
- the shape of the encapsulant 164 is determined by the molds used to encapsulate the package 162 (illustrated in FIG. 11 ) and the solder balls 70 .
- the encapsulant 164 may encase more than 50% of the solder ball 70 .
- the solder ball diameter D may be about 0.4 mm.
- solder ball 70 may protrude away from the surface of the encapsulant 164 .
- the protruding portion of the solder ball 70 provides a conductive contact such that the package 162 may be electrically coupled to a system, as previously described.
- the protruding portion of the solder ball 70 may have a height H of about 0.15 mm with respect to the surface of the encapsulant 164 .
- the diameter of the solder balls 70 and the height of the protrusion may vary, depending on the specific application.
- the amount of the solder balls 70 that is encapsulated may be also vary.
- the encapsulant 164 may be disposed to cover an amount of the surface area of the solder ball 70 defined by about 40% to about 85% of the diameter D of the solder ball 70 and more typically, about 50% to about 70%. According to the present dimensions, a surface area defined by approximately 62% of the diameter of the solder ball 70 is encapsulated in the present exemplary embodiment.
- FIG. 11 illustrates an exploded view of a mold 170 , which may include an upper mold 172 and a lower mold 174 used to create the encapsulated circuit package 162 .
- the circuit package 162 is placed between the upper mold 172 and the lower mold 174 .
- a liner 176 is provided to facilitate the formation of the encapsulant 164 about the solder balls 70 such that a portion of the solder balls 70 is left exposed after the encapsulation process.
- the liner 176 comprises a compliant film, such as a fluoropolymer film or an ethylene tetrafluoroethylene copolymer film, for example.
- the compression ratio of the liner 176 coincides with the protruding portion of the solder ball 70 .
- the liner 176 prevents coverage of the entire solder ball 70 during the encapsulation process by conforming around a portion of the solder ball 70 during in the encapsulation process, thereby creating a protruding portion of the solder ball 70 which is blocked from receiving the encapsulant 164 .
- the liner 176 may have a thickness of about 0.3 mm and have a compression ratio that allows the encapsulation of the surface of the solder ball 70 defined by about 40% to about 85% of the diameter D of the solder ball 70 and more specifically, about 50% to about 70%.
- the upper mold 172 may comprise the liner 176 . That is to say, the upper mold 172 has a resilient layer that is conformally compressed about the solder balls 70 when the solder balls are pressed into contact with the upper mold 172 .
- FIG. 12 illustrates an enlarged view of the solder ball area during the encapsulation process.
- the upper mold 172 presses the liner 176 into contact with the solder ball 70 .
- the liner 176 is compressed by the solder ball 70 and conforms to the shape of the solder ball 70 .
- a portion of the solder ball 70 is completely covered by the liner 176 .
- the cavity 178 i 8 s filled with encapsulant 164 The liner 176 will prevent the encapsulant 164 from encapsulating the top, covered portion of the solder ball 70 .
- the liner 176 has a compression ratio that allows a surface area defined by about 35% of the diameter D of the solder ball 70 to remain unencapsulated.
- the thickness, material and/or compression ratio of the liner 176 may be selected to provide a desirable coverage area.
Abstract
A BGA and a system implementing a BGA. Specifically, a BGA package is encapsulated after the balls are attached to the package. The backside of the package having the balls disposed thereon may be completely covered by the encapsulant. The encapsulant is disposed in direct contact about a portion of the balls. A liner is provided to facilitate the formation of an unencapsulated portion of each ball. The unencapsulated portion may be used to couple the package to a system.
Description
- The present application is a Divisional Application of pending application Ser. No. 10/230,569 filed on Aug. 29, 2002, which is a Continuation-in-part of application Ser. No. 10/120,814 filed on Apr. 11, 2002, which is a continuing application under 37 C.F.R. § 1.53(b) of application Ser. No. 09/568,676 filed on May 11, 2000, which issued as U.S. Pat. No. 6,400,574 on Jun. 4, 2002.
- 1. Field of the Invention
- The present invention relates generally to microelectronic packaging and, more particularly, to a method and apparatus for encapsulating a ball grid array (BGA) in a molding compound.
- 2. Description of the Related Art
- This section is intended to introduce the reader to various aspects of art which may be related to various aspects of the present invention which are described and/or claimed below. This discussion is believed to be helpful in providing the reader with background information to facilitate a better understanding of the various aspects of the present invention. Accordingly, it should be understood that these statements are to be read in this light, and not as admissions of prior art.
- The packaging of electrical circuits is a key element in the technological development of any device containing electrical components. Several technologies have been developed to provide a means of mounting these electrical components on a surface of a substrate, such as a printed circuit board (PCB). Fine pitch surface mount (FPT), pin grid array (PGA), and ball grid array (BGA) are examples of leading surface mount technologies.
- BGA technology offers several advantages over FPT and PGA. Among the most often cited advantages of BGA are: reduced co-planarity problems, since there are no leads; reduced placement problems; reduced paste printing problems; reduced handling damage; smaller size; better electrical and thermal performance; better package yield; better board assembly yield; higher interconnect density; multi-layer interconnect options; higher number of IO's for a given footprint; easier extension to multi-chip modules; and faster design-to-production cycle time.
- A BGA semiconductor package generally includes a semiconductor chip mounted on the top surface of a substrate. The semiconductor chip may be electrically coupled to the substrate by bond wires. The substrate contains conductive routing which allows the signals to pass from the semiconductor chip on the top side of the substrate, through the substrate, and to pads on the backside of the substrate. A plurality of solder balls are deposited and electrically coupled to the pads on the backside of the substrate to be used as input/output terminals for electrically connecting the substrate to a PCB or other external device.
- One problem with conventional BGA packaging is the need to protect the electrical interface between the chip and the substrate. To protect the semiconductor chip and bond wires from external elements such as moisture, dust, or impact, the semiconductor chip is often encapsulated in a molding compound. The implementation of the encapsulation process presents many challenges.
- Advantages and features of the invention may become apparent upon reading the following detailed description and upon reference to the drawings in which:
-
FIG. 1 illustrates a block diagram of an exemplary processor-based device in accordance with the present invention; -
FIG. 2 illustrates an exemplary memory array; -
FIG. 3 illustrates an exemplary encapsulated circuit package; -
FIG. 4 illustrates a cross sectional view of a BOC package; -
FIG. 5 illustrates an encapsulated circuit package in accordance with one aspect of the present techniques; -
FIG. 6 illustrates a cross-sectional view of an encapsulated circuit package in accordance with one aspect of the present techniques, taken along line 6-6; -
FIG. 7A illustrates an enlarged view of the solder ball area illustrated inFIG. 6 ; -
FIG. 7B illustrates a first alternate embodiment of the solder ball area illustrated inFIG. 6 ; -
FIG. 7C illustrates a second alternate embodiment of the solder ball area illustrated inFIG. 6 ; -
FIG. 7D illustrates a third alternate embodiment of the solder ball area illustrated inFIG. 6 ; -
FIG. 8 illustrates an exploded view of an exemplary mold used to create the encapsulated circuit package illustrated inFIG. 5 ; -
FIG. 9 illustrates a cross-sectional view of an encapsulated circuit package in accordance with another aspect of the present techniques; -
FIG. 10 illustrates an enlarged view of the solder ball area illustrated inFIG. 9 ; -
FIG. 11 illustrates an exploded view of an exemplary mold used to create the encapsulated circuit package illustrated inFIG. 9 ; and -
FIG. 12 illustrates an enlarged cross-sectional view of the solder ball area during the encapsulation process in accordance with the embodiment illustrated inFIG. 9 . - One or more specific embodiments of the present invention will be described below. In an effort to provide a concise description of these embodiments, not all features of an actual implementation are described in the specification. It should be appreciated that in the development of any such actual implementation, as in any engineering or design project, numerous implementation-specific decisions must be made to achieve the developers' specific goals, such as compliance with system-related and business-related constraints, which may vary from one implementation to another. Moreover, it should be appreciated that such a development effort might be complex and time consuming, but would nevertheless be a routine undertaking of design, fabrication, and manufacture for those of ordinary skill having the benefit of this disclosure.
- Turning now to the drawings, and referring initially to
FIG. 1 , a block diagram depicting an exemplary processor-based device generally designated by thereference numeral 10 is illustrated. Thedevice 10 may be any of a variety of different types, such as a computer, pager, cellular telephone, personal organizer, control circuit, etc. In a typical processor-based device, aprocessor 12, such as a microprocessor, controls many of the functions of thedevice 10. - The
device 10 typically includes apower supply 14. For instance, if thedevice 10 is portable, thepower supply 14 would advantageously include permanent batteries, replaceable batteries, and/or rechargeable batteries. Thepower supply 14 may also include an AC adapter, so the device may be plugged into a wall outlet, for instance. In fact, thepower supply 14 may also include a DC adapter, so that the device can be plugged into a vehicle cigarette lighter, for instance. - Various other devices may be coupled to the
processor 12 depending upon the functions that thedevice 10 performs. For instance, auser interface 16 may be coupled to theprocessor 12. Theuser interface 16 may include buttons, switches, a keyboard, a light pen, a mouse, and/or a voice recognition system, for instance. Adisplay 18 may also be coupled to theprocessor 12. Thedisplay 18 may include an LCD display, a CRT, LEDs, and/or an audio display, for example. Furthermore, an RF subsystem/baseband processor 20 may also be coupled to theprocessor 12. The RF subsystem/baseband processor 20 may include an antenna that is coupled to an RF receiver and to an RF transmitter (not shown). Acommunications port 22 may also be coupled to theprocessor 12. The communications port may be adapted to be coupled to aperipheral device 24, such as a modem, a printer, or a computer, for instance, or to a network, such as a local area network or the Internet, for instance.Volatile memory 26 andnon-volatile memory 28 may also be coupled to theprocessor 12. -
FIG. 2 illustrates amulti-chip memory array 29. For the sake of clarity, elements similar to the elements previously described will be designated by like reference numerals. Thememory array 29 may be illustrative ofvolatile memory 26 ornon-volatile memory 28. In this arrangement, amemory controller 31 is coupled to a plurality ofmemory devices 33. Thememory controller 31 and thememory devices 33 are mounted in a planar fashion on thesame substrate 35, such as a printed circuit board. Disadvantageously, this planar layout allows for only a limited number ofmemory devices 33 to be used depending on the surface area of thesubstrate 35. -
FIG. 3 illustrates a partial cross-sectional view depicting an exemplary encapsulatedcircuit package 30. Thecircuit package 30 typically includes asemiconductor chip 40, such as a memory die. Thesemiconductor chip 40 is mounted on asubstrate 50 and electrically coupled to thesubstrate 50 bybond wires 45.Bond wires 45 are attached tobond pads 46 on thefirst surface 42 of thesemiconductor chip 40 and to bondpads 47 on thefirst surface 52 of thesubstrate 50. Amolding compound 60 is generally used to encapsulate thesemiconductor chip 40. Themolding compound 60 protects thesemiconductor chip 40 and thebond wires 45 from external elements. Terminals, such as pins orsolder balls 70, may be disposed on the backside of thesubstrate 50 so that thecircuit package 30 may be electrically coupled to a printed circuit board (PCB) to incorporate thecircuit package 30 into a system. Thesubstrate 50 also includes conductive routing and/or vias (not shown) to provide an electrical signal path from thesolder pads 47 to thesolder balls 70. - Alternately, a board-on-chip (BOC) circuit package may be encapsulated, with molding compound disposed on both surfaces of the
substrate 51, as illustrated inFIG. 4 . In this embodiment, thesemiconductor chip 41 may be mounted with thefirst surface 42 of thesemiconductor chip 41 placed in contact with thefirst surface 52 of thesubstrate 51. In this example, aslot 43 is formed in thesubstrate 51, andbond pads 46 on thefirst surface 42 of thesemiconductor chip 41 are aligned so as to allowbond wires 45 to be attached tobond pads 46 on thefirst surface 42 of thesemiconductor chip 41, and further attached tobond pads 47 on thesecond surface 54 of thesubstrate 51. During the encapsulation process, moldingcompound 60 may be disposed on thesecond surface 44 of thesemiconductor chip 41 which is not in contact with thesubstrate 51 and may be disposed on thefirst surface 52 of thesubstrate 51. Themolding compound 60 may be disposed through theslot 43 in thesubstrate 51 and on a portion of thesecond surface 54 of thesubstrate 51. -
FIG. 5 illustrates an exemplary encapsulatedcircuit package 75 in accordance with one aspect of the present techniques. Themolding compound 60 is used to encapsulate theentire circuit package 75, including the backside of thecircuit package 75. Thecircuit package 75 is encapsulated withmolding compound 60 in such a way as to provide openings in themolding compound 60 to allow thecircuit package 75 to be coupled to a printed circuit board. In one example, cups 80 are formed in themolding compound 60. Thecups 80 are configured to receive solder balls (not shown) which provide electrical coupling of thecircuit package 75 to a printed circuit board. Thecups 80 are configured to align withpads 90 which are coupled to the second surface of thesubstrate 50 contained within themolding compound 60. -
FIG. 6 illustrates a cross-sectional view of an encapsulatedBOC circuit package 75 in accordance with one aspect of the present techniques, taken along line 6-6. As inFIG. 4 , asemiconductor chip 41 is typically coupled to thesubstrate 51 by an adhesive 100, such as a dielectric tape or non-conductive paste. Thefirst surface 42 of thesemiconductor chip 41 is coupled to thefirst surface 52 of thesubstrate 51 byadhesive 100. Thesemiconductor chip 41 is electrically coupled to conductors of thesubstrate 51 bybond wires 45. Thebond wires 45 are coupled tobond pads 46 located on thefirst surface 42 of thesemiconductor chip 41 and further coupled tobond pads 47 on thesecond surface 54 of thesubstrate 51. In this BOC embodiment, thesubstrate 51 includes aslot 110 through which thebond wires 45 are attached. Thecircuit package 75 is encapsulated with themolding compound 60 which is deposited on thesecond surface 44 of thesemiconductor chip 41, thefirst surface 52 of thesubstrate 51, through theslot 110 and onto thesecond surface 54 of thesubstrate 51.Cup openings 80 are configured to align withsolder pads 90 on thesecond surface 54 of thesubstrate 51. Thecups 80 advantageously have taperedwalls 120 which facilitate alignment of thesolder balls 70 with thesolder pads 90. -
FIG. 7A illustrates an enlarged view of the solder ball area illustrated inFIG. 6 . Thecup 80 a in themolding compound 60 is configured such that the base of the cup is smaller than thesolder pad 90 a. Thus, the solder mask used to dispense thesolder balls 70 determine thesolder ball 70 location. The taperedwalls 120 allow for proper alignment of thesolder ball 70 over thesolder pad 90 a. Alternately, thecup 80 a may be a hemisphere sized to hold asolder ball 70 as illustrated inFIG. 7C . Further, thecup 80 a may be cylindrical in shape as illustrated inFIG. 7D . Thesolder pad 90 a is coupled to thesecond surface 54 of thesubstrate 51 to provide electrical coupling of thesolder balls 70 to thesubstrate 51. -
FIG. 7B illustrates an alternate embodiment of the solder ball area illustrated inFIG. 6 . Here, thecup 80 b contained within themolding compound 60 is configured such that the opening is larger than thesolder pad 90 b. While the taperedwalls 120 in thecup 80 b may direct the alignment of thesolder ball 70 within thecup 80 b, it is the location of thesolder pad 90 b which actually determines the exact placement of thesolder ball 70, because thesolder ball 70 will be attracted to the wettedsolder pad 90 b during the re-flow process that couples thesolder ball 70 to thesubstrate 51. Again,solder pad 90 b is coupled to thesecond surface 54 ofsubstrate 51 to provide for electrical coupling between thesolder ball 70 and thesubstrate 51. -
FIG. 8 illustrates an exploded view of amold 125, which may include anupper mold 130 and alower mold 140 used to create an encapsulated circuit package in accordance with the first aspect of the present techniques, illustrated with reference toFIGS. 5, 6 , 7A and 7B. During the encapsulation process, thecircuit package 75 is placed between theupper mold 130 and thelower mold 140. Arelease liner 150 may be used to provide separation of thecircuit package 75 from theupper mold 130 after the encapsulation process is complete. Theupper mold 130 includes a plurality ofprotrusions 160 which are brought in contact with the solder pads (not shown) on thesecond surface 54 ofsubstrate 51. Theprotrusions 160 may be tapered to create the tapered walls of thecups 80, as shown inFIGS. 5-7B . During the molding process, theprotrusions 160 of theupper mold 130 are brought in contact with the solder pads 90 (separated byrelease liner 150, if used). Thesecond surface 54 of thesubstrate 51 is brought in contact with theupper mold 130, while thefirst surface 52 of thesubstrate 50 is brought in contact with thelower mold 140. A molding compound is then injected into an opening (not shown) in themolds circuit package 75 is separated from themolds circuit package 75 is encapsulated and includes the alignment cups used for solder ball deposition as described above. - As previously described,
FIGS. 5-8 illustrate a technique for fabricating a molded ball grid array by encapsulating the device before disposing the solder balls.FIGS. 9-12 illustrate a second aspect of the present techniques, wherein the solder balls are disposed before the encapsulation process. Specifically,FIG. 9 illustrates a cross-sectional view of an encapsulated package, such as aBOC package 162, wherein thesolder balls 70 are attached to thesecond surface 54 of thesubstrate 51 before thepackage 162 is encapsulated. As previously described with reference toFIG. 6 , asemiconductor chip 41 is typically coupled to thesubstrate 51 by an adhesive 100. Thesemiconductor chip 41 is electrically coupled to conductors of the substrate bybond wires 45, for example. Thebond wires 45 are coupled tobond pads 46 located on thefirst surface 42 of thesemiconductor chip 41 and further coupled tobond pads 47 on thesecond surface 54 of thesubstrate 51. In this embodiment of thepackage 162, thesubstrate 51 includes aslot 110 through which thebond wires 45 are attached. After thesolder balls 70 are coupled to thesolder pads 90, thepackage 162 is encapsulated with anencapsulant 164 such as a liquid plastic, resin, or molding compound. -
FIG. 10 illustrates an enlarged view of the solder ball area illustrated inFIG. 9 . Because thesolder balls 70 are coupled to thesolder pads 90 before the deposition of theencapsulant 164, there are no cups formed in theencapsulant 164 in which to deposit thesolder ball 70, as with the first exemplary technique described with reference toFIGS. 5-8 . Instead, the shape of theencapsulant 164 is determined by the molds used to encapsulate the package 162 (illustrated inFIG. 11 ) and thesolder balls 70. As indicated inFIG. 10 , theencapsulant 164 may encase more than 50% of thesolder ball 70. In one exemplary embodiment, the solder ball diameter D may be about 0.4 mm. After the encapsulation process, a portion of thesolder ball 70 may protrude away from the surface of theencapsulant 164. The protruding portion of thesolder ball 70 provides a conductive contact such that thepackage 162 may be electrically coupled to a system, as previously described. - In the present exemplary embodiment, the protruding portion of the
solder ball 70 may have a height H of about 0.15 mm with respect to the surface of theencapsulant 164. As can be appreciated, the diameter of thesolder balls 70 and the height of the protrusion may vary, depending on the specific application. Further, the amount of thesolder balls 70 that is encapsulated may be also vary. For instance, theencapsulant 164 may be disposed to cover an amount of the surface area of thesolder ball 70 defined by about 40% to about 85% of the diameter D of thesolder ball 70 and more typically, about 50% to about 70%. According to the present dimensions, a surface area defined by approximately 62% of the diameter of thesolder ball 70 is encapsulated in the present exemplary embodiment. -
FIG. 11 illustrates an exploded view of amold 170, which may include anupper mold 172 and alower mold 174 used to create the encapsulatedcircuit package 162. During the encapsulation process, thecircuit package 162 is placed between theupper mold 172 and thelower mold 174. Aliner 176 is provided to facilitate the formation of theencapsulant 164 about thesolder balls 70 such that a portion of thesolder balls 70 is left exposed after the encapsulation process. Theliner 176 comprises a compliant film, such as a fluoropolymer film or an ethylene tetrafluoroethylene copolymer film, for example. The compression ratio of theliner 176 coincides with the protruding portion of thesolder ball 70. Theliner 176 prevents coverage of theentire solder ball 70 during the encapsulation process by conforming around a portion of thesolder ball 70 during in the encapsulation process, thereby creating a protruding portion of thesolder ball 70 which is blocked from receiving theencapsulant 164. In one exemplary embodiment, theliner 176 may have a thickness of about 0.3 mm and have a compression ratio that allows the encapsulation of the surface of thesolder ball 70 defined by about 40% to about 85% of the diameter D of thesolder ball 70 and more specifically, about 50% to about 70%. Accordingly, after the encapsulation process a protruding (unencapsulated) portion of the solder ball is created. Alternatively, theupper mold 172 may comprise theliner 176. That is to say, theupper mold 172 has a resilient layer that is conformally compressed about thesolder balls 70 when the solder balls are pressed into contact with theupper mold 172. -
FIG. 12 illustrates an enlarged view of the solder ball area during the encapsulation process. As can be appreciated, theupper mold 172 presses theliner 176 into contact with thesolder ball 70. Theliner 176 is compressed by thesolder ball 70 and conforms to the shape of thesolder ball 70. Thus, a portion of thesolder ball 70 is completely covered by theliner 176. During the encapsulation process, thecavity 178 i8s filled withencapsulant 164 Theliner 176 will prevent the encapsulant 164 from encapsulating the top, covered portion of thesolder ball 70. In the present exemplary embodiment, theliner 176 has a compression ratio that allows a surface area defined by about 35% of the diameter D of thesolder ball 70 to remain unencapsulated. As can be appreciated, the thickness, material and/or compression ratio of theliner 176 may be selected to provide a desirable coverage area. - While the invention may be susceptible to various modifications and alternative forms, specific embodiments have been shown by way of example in the drawings and have been described in detail herein. However, it should be understood that the invention is not intended to be limited to the particular forms disclosed. Rather, the invention is to cover all modifications, equivalents, and alternatives falling within the spirit and scope of the invention as defined by the following appended claims.
Claims (20)
1. A molded ball grid array comprising:
a substrate having a first surface and a second surface;
a plurality of conductive balls coupled to the first surface of the substrate;
a semiconductor device coupled to the second surface of the substrate; and
an encapsulant disposed over the first surface of the substrate and disposed conformally about the conductive balls, wherein the encapsulant conforms to the shape of the plurality of conductive balls and covers only a portion of the surface area of the plurality of conductive balls.
2. The molded ball grid array, as set forth in claim 1 , wherein the semiconductor device comprises a memory device.
3. The molded ball grid array, as set forth in claim 1 , wherein the semiconductor device is electrically coupled to the substrate.
4. The molded ball grid array, as set forth in claim 1 , wherein the encapsulant is disposed on at least a portion of the semiconductor device.
5. The molded ball grid array, as set forth in claim 1 , wherein the plurality of conductive balls comprises a plurality of solder balls.
6. The molded ball grid array, as set forth in claim 1 , wherein the encapsulant comprises a molding compound.
7. The molded ball grid array, as set forth in claim 1 , wherein the encapsulant comprises a resin.
8. The molded ball grid array, as set forth in claim 1 , wherein the encapsulant is disposed conformally around the conductive balls and covers a portion of the conductive balls, wherein the portion is a surface area defined by about 40% to about 85% of the diameter of the conductive balls.
9. The molded ball grid array, as set forth in claim 1 , wherein the encapsulant is disposed conformally around the conductive balls and covers a portion of the conductive balls, wherein the portion is a surface area defined by about 50% to about 70% of the diameter of the conductive balls.
10. The molded ball grid array, as set forth in claim 1 , wherein the encapsulant is disposed conformally around the conductive balls and covers a portion of the conductive balls, wherein the portion is a surface area defined by greater than 50% of the diameter of the conductive balls.
11. A system comprising:
a processor; and
a package operatively coupled to the processor, wherein the package comprises:
a substrate having a first surface and a second surface;
a plurality of conductive balls coupled to the first surface of the substrate;
a semiconductor device coupled to the second surface of the substrate; and
an encapsulant disposed over the first surface of the substrate and disposed conformally about the conductive balls, wherein the encapsulant conforms to the shape of the plurality of conductive balls and covers a portion of the surface area of the plurality of conductive balls.
12. The system, as set forth in claim 11 , wherein the semiconductor device comprises a memory device.
13. The system, as set forth in claim 11 , wherein the semiconductor device is electrically coupled to the substrate.
14. The system, as set forth in claim 11 , wherein the encapsulant is disposed on at least a portion of the semiconductor device.
15. The system, as set forth in claim 11 , wherein the plurality of conductive balls comprises a plurality of solder balls.
16. The system, as set forth in claim 11 , wherein the encapsulant comprises a molding compound.
17. The system, as set forth in claim 11 , wherein the encapsulant comprises a resin.
18. The system, as set forth in claim 11 , wherein the encapsulant is disposed conformally around the conductive balls and covers a portion of the conductive balls, wherein the portion is a surface area defined by about 40% to about 85% of the diameter of the conductive balls.
19. The system, as set forth in claim 11 , wherein the encapsulant is disposed conformally around the conductive balls and covers a portion of the conductive balls, wherein the portion is a surface area defined by about 50% to about 70% of the diameter of the conductive balls.
20. The system, as set forth in claim 11 , wherein the encapsulant is disposed conformally around the conductive balls and covers a portion of the conductive balls, wherein the portion is a surface area defined by greater than 50% of the diameter of the conductive balls.
Priority Applications (1)
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US10/930,520 US20050029554A1 (en) | 2000-05-11 | 2004-08-31 | Molded ball grid array |
Applications Claiming Priority (4)
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US09/568,676 US6400574B1 (en) | 2000-05-11 | 2000-05-11 | Molded ball grid array |
US10/120,814 US20020121695A1 (en) | 2000-05-11 | 2002-04-11 | Molded ball grid array |
US10/230,569 US6916683B2 (en) | 2000-05-11 | 2002-08-29 | Methods of fabricating a molded ball grid array |
US10/930,520 US20050029554A1 (en) | 2000-05-11 | 2004-08-31 | Molded ball grid array |
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US10/230,569 Division US6916683B2 (en) | 2000-05-11 | 2002-08-29 | Methods of fabricating a molded ball grid array |
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US10/230,569 Expired - Lifetime US6916683B2 (en) | 2000-05-11 | 2002-08-29 | Methods of fabricating a molded ball grid array |
US10/930,520 Abandoned US20050029554A1 (en) | 2000-05-11 | 2004-08-31 | Molded ball grid array |
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US7952198B2 (en) * | 2006-10-05 | 2011-05-31 | Chipmos Technologies (Bermuda) Ltd. | BGA package with leads on chip |
US8409920B2 (en) * | 2007-04-23 | 2013-04-02 | Stats Chippac Ltd. | Integrated circuit package system for package stacking and method of manufacture therefor |
US8022538B2 (en) * | 2008-11-17 | 2011-09-20 | Stats Chippac Ltd. | Base package system for integrated circuit package stacking and method of manufacture thereof |
US9006887B2 (en) | 2009-03-04 | 2015-04-14 | Intel Corporation | Forming sacrificial composite materials for package-on-package architectures and structures formed thereby |
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US6916683B2 (en) | 2005-07-12 |
US20020195708A1 (en) | 2002-12-26 |
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